# US 9,927,233 B2 · Coating thickness measuring instrument and methods > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 9,927,233 B2 - Document ID: US9927233B2 - Status: Granted - Kind: B2 - Application number: 13/738,809 - Filed: 2013-01-10 - Published: 2014-07-10 - Granted: 2018-03-27 - Earliest claimed: 2013-01-10 - Assignees: Elcometer Limited - Applicants: Michael Carrington Sellars; Joseph J. Walker - Inventors: Michael Carrington Sellars; Joseph J. Walker - Web page: https://patentgrep.com/patent/US9927233B2 ## CPC - G01B 7/105: {for measuring thickness of coating} - G01B 21/08: for measuring thickness - G01B 17/025: {for measuring thickness of coating} - G06F 17/00: Digital computing or data processing equipment or methods, specially adapted for specific functions (information retrieval, database structures or file system structures therefor G06F16/00) - G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS - G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N) ## Abstract A coating thickness measuring instrument has a probe for measuring the thickness of a coating applied to a substrate and producing an output relating to the measured thickness; a memory storing calibration data; and a processor arranged to process the output produced by the probe, together with calibration data stored by the memory, and produce a coating thickness measurement. The memory stores at least two sets of calibration data, each set associated with a different surface profile value and a user may select the set of calibration data to be used by the processor according to the surface profile of the substrate on which a measurement is to be made. This enables a user to make coating thickness measurements on substrates with at least two different, known, surface profiles without having to calibrate the instrument specifically for those surfaces. ## Claims ### Claim 1 A coating thickness measuring instrument comprising: a. an electromagnetic probe for measuring the thickness of a coating applied to a surface and producing an output relating to the measured thickness; b. a memory for storing calibration data; c. a processor arranged to process the output produced by the probe, together with calibration data stored by the memory, to produce a calibrated coating thickness measurement value; d. at least two sets of calibration data, obtained by making measurements on at least two surfaces with known, different average surface profiles, pre-stored in the memory; and wherein each set of calibration data is associated with a different known average surface profile value, wherein the processor receives a user selection of the set of calibration data to be used by the processor according to the average surface profile of the surface on which a measurement is to be made, and wherein the processor determines the calibrated coating thickness measurement value based on the output relating to the measured thickness produced by the electromagnetic probe and the set of calibration data selected by the user. ### Claim 2 (depends on 1) A coating thickness measuring instrument as claimed in claim 1 wherein three or more sets of calibration data, each associated with a different known average surface profile, are pre-stored in the memory. ### Claim 3 (depends on 1) A coating thickness measuring instrument as claimed in claim 1 wherein the sets of calibration data are stored in a non-volatile memory. ### Claim 4 (depends on 1) A coating thickness measuring instrument as claimed in claim 1 wherein the user selection includes an average surface profile value from a range of values, each value associated with a different set of calibration data. ### Claim 5 (depends on 1) A coating thickness measuring instrument as claimed in claim 1 wherein the probe is removably mounted to the remainder of the instrument enabling different probes to be used with the instrument, and the memory stores at least two sets of calibration data, each set associated with a different known average surface profile, for use in calibration of measurements made by one probe and at least two different sets of calibration data, each set associated with a different known average surface profile, for use in calibration of measurements made by another probe. ### Claim 6 (depends on 1) A coating thickness measuring instrument as claimed in claim 1 wherein the probe is removably mounted to the remainder of the instrument and the memory storing sets of calibration data is mounted to the probe for removal from the remainder of the instrument with the probe. ### Claim 7 (depends on 1) The coating thickness measuring instrument of claim 1, further comprising an input device that enables a user to enter the user selection. ### Claim 8 (depends on 1) The coating thickness measuring instrument of claim 1, wherein the processor displays the calibrated coating thickness measurement value on a display device. ### Claim 9 (depends on 4) The coating thickness measuring instrument of claim 4, further comprising a display which displays the range of values. ### Claim 10 A method of measuring the thickness of a coating on a surface with a known average surface profile comprising the steps of: a. providing a coating thickness measuring instrument comprising: i. an electromagnetic probe for measuring the thickness of a coating applied to a surface and producing an output relating to the measured thickness; ii. a memory for storing calibration data; iii. a processor arranged to process the output produced by the probe, together with calibration data stored by the memory, to produce a calibrated coating thickness measurement value; iv. at least two sets of calibration data, obtained by making measurements on at least two surfaces with known, different average surface profiles, stored in the memory; and wherein each set of calibration data is associated with a different known average surface profile value, and wherein the processor receives a user selection of the set of calibration data to be used by the processor according to the average surface profile of the surface on which a measurement is to be made; b. selecting from the average surface profile values stored by the instrument in association with sets of calibration data the average surface profile value closest to the known average surface profile, thereby to select a set of calibration data to be used by the instrument; and c. using the instrument to measure coating thickness on the surface, wherein the processor receives the selection of the set of calibration data to be used by the instrument, and wherein the processor determines the calibrated coating thickness measurement value based on the output relating to the measured thickness produced by the electromagnetic probe and the selected set of calibration data. ### Claim 11 (depends on 10) The method of claim 10, wherein the processor displays the calibrated coating thickness measurement value on a display device. ### Claim 12 A coating thickness measuring instrument comprising: a. an electromagnetic probe for measuring a thickness of a coating applied to a surface and producing an output relating to the measured thickness; b. a memory including pre-stored calibration data, the pre-stored calibration data including at least two sets of calibration data, each set associated with a different known average surface profile value; and c. a processor adapted to process data stored in the memory, to produce a calibrated coating thickness measurement value, wherein the processor receives a user selection of a set of calibration data to be used by the processor, and wherein the processor determines the calibrated coating thickness measurement value based on the output relating to the measured thickness produced by the electromagnetic probe and the set of calibration data selected by the user. ### Claim 13 (depends on 12) The instrument of claim 12, wherein the selected set of calibration data used by the processor is selected according to an average surface profile of a surface on which a measurement is to be made. ### Claim 14 (depends on 12) The instrument of claim 12, wherein the processor displays the calibrated coating thickness measurement value on a display device. ### Claim 15 (depends on 13) The instrument of claim 13, wherein the selected set of calibration data used by the processor is selected responsive to a received user selection.