Ocular metrology employing spectral wavefront analysis of reflected light
OwnerSteven James Frisken, Grant Andrew Friskeninventors
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OwnerSteven James Frisken, Grant Andrew Friskeninventors
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Method and systems are presented for analyzing a wavefront using a spectral wavefront analyzer to extract optical phase and spectral information at a two dimensional array of sampling points across the wavefront, wherein the relative phase information between the sampling points is maintained. Methods and systems are also presented for measuring an eye by reflecting a wavefront of an eye and measuring the wavefront at a plurality of angles to provide a map of the off-axis relative wavefront curvature and aberration of the eye. The phase accuracy between wavelengths and sample points over a beam aperture offered by these methods and systems have a number of ocular applications including corneal and anterior eye tomography, high resolution retinal imaging, and wavefront analysis as a function of probe beam incident angle for determining myopia progression and for designing and testing lenses for correcting myopia.
An optical system for analysing a wavefront obtained by reflection or transmission of one or more probe beams from or through a sample, said system comprising a spectral wavefront analyser adapted to extract optical phase and spectral information at multiple sampling points across said wavefront, wherein the relative phase between said multiple sampling points is maintained while the phase information at said multiple sampling points relative to a reference beam is obtained, wherein said multiple sampling points form a two dimensional sampling array, and wherein said system comprises a processor adapted to process said optical phase and spectral information to provide a tomographic profile of said sample.
A method for analysing a wavefront obtained by reflection or transmission of one or more probe beams from or through a sample, said method comprising the step of extracting optical phase and spectral information at multiple sampling points across said wavefront, wherein the relative phase between said multiple sampling points is maintained while the phase information at said multiple sampling points relative to a reference beam is obtained, wherein said multiple sampling points form a two dimensional sampling array, and wherein said method further comprises the step of processing said optical phase and spectral information to provide a tomographic profile of said sample.
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