Ambient desorption, ionization, and excitation for spectrometry
AssigneeAgilent Technologies, Inc.
InventorsViorica Lopez-Avila, Mark Denning, Mehrnoosh Vahidpour
Life of this patent
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Abstract
An ion source includes a plasma generator for supplying plasma at an ionization region proximate to a sample surface. The plasma generator applies energy that may be utilized for desorbing analytes from the sample surface as well as for generating plasma by which analytes are excited or ionized. Desorption and ionization/excitation may be controlled as individual modes. The ion source may be interfaced with an ion-based or optical-based spectrometer. A sample support may be provided, which may be capable of performing analytical separation.
Claims20
An ion source, comprising:
- a plasma generator configured for supplying plasma at an ionization region proximate to a sample surface, the plasma generator comprising a plasma generating component, wherein the plasma generator is configured for switching between operating in a desorption mode and in an ionization mode, wherein:
- in the desorption mode, the plasma generating component applies energy effective for heating a sample disposed at or part of the sample surface without exposing the sample to active plasma, wherein the energy is applied to a component selected from the group consisting of the sample, the sample surface, a sample support on which the sample is supported, a plasma precursor gas, and a combination of two or more of the foregoing;
- and
- in the ionization mode, the plasma generating component applies energy to the plasma precursor gas effective for generating active plasma from the plasma precursor gas and exposing the sample to the active plasma;
- and
- an interface configured for transferring analyte ions or photons produced in the plasma generated by the plasma generating component to a spectrometer.
An ion source, comprising:
- a planar sample support comprising a sample surface and configured for performing analytical separation on the sample surface;
- and
- a plasma generator configured for supplying plasma at an ionization region proximate to the sample surface, the plasma generator comprising a gas outlet for supplying a plasma precursor gas, and a plasma generating component configured for generating a localized microwave energy field, and the plasma generator configured for switching between operating in a desorption mode and in an ionization mode, wherein:
- in the desorption mode, the plasma generating component applies energy effective for heating a sample disposed at or part of the sample surface without exposing the sample to active plasma, wherein the energy is applied to a component selected from the group consisting of the sample, the sample surface, a sample support on which the sample is supported, a plasma precursor gas, and a combination of two or more of the foregoing;
- and
- in the ionization mode, the plasma generating component applies energy to the plasma precursor gas effective for generating active plasma from the plasma precursor gas and exposing the sample to the active plasma.
A method for ionizing a sample, the method comprising:
- providing a sample;
- desorbing analytes from the sample by operating a plasma generating component to apply energy under conditions effective for heating the sample without actively generating plasma, wherein the energy is applied to a component selected from the group consisting of the sample, a sample surface of the sample, a sample support on which the sample is supported, a plasma precursor gas, and a combination of two or more of the foregoing;
- and
- generating plasma above a sample surface of the sample by operating a plasma generating component to apply energy to the plasma precursor gas under conditions effective for generating the plasma, wherein the plasma ionizes the desorbed analytes.
Dependencies are inferred from the claim text.