Analog-to-digital converter with embedded noise-shaped truncation, embedded noise-shaped segmentation and/or embedded excess loop delay compensation

A quantizer comprising:

• a multi-bit analog-to-digital converter (ADC), having an internal digital-to-analog converter (DAC) associated with comparison of each sampled analog input of the multi-bit ADC, wherein the multi-bit ADC converts a currently-sampled analog input into a first digital output and further converts an earlier-sampled analog input into a second digital output, a first noise-shaped truncation output is derived from the first digital output, and a second noise-shaped truncation output is derived from the second digital output;
• and
• a DAC feedback circuit, configured to transfer a first truncation residue associated with the first noise-shaped truncation output to the internal DAC and further transfer a second truncation residue associated with the second noise-shaped truncation output to the internal DAC, wherein the transferred second truncation residue is reflected in comparison of the currently-sampled analog input of the multi-bit ADC via the internal DAC, and the transferred first truncation residue is reflected in comparison of a later-sampled analog input of the multi-bit ADC via the internal DAC;
• and
• a first adder, configured to subtract the second truncation residue from the first truncation residue to generate a third noise-shaped truncation output, wherein the first noise-shaped truncation output and the third noise-shaped truncation output are noise-shaped segmentation outputs of the currently-sampled analog input.