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AssigneeOb Realty, LLC
InventorsMehrdad M. Moslehi, Karl-Josef Kramer, Jay Ashjaee, George D. Kamian, David Mordo, Takao Yonehara
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High productivity thin film deposition methods and tools are provided wherein a thin film semiconductor material layer with a thickness in the range of less than 1 micron to 100 microns is deposited on a plurality of wafers in a reactor. The wafers are loaded on a batch susceptor and the batch susceptor is positioned in the reactor such that a tapered gas flow space is created between the susceptor and an interior wall of the reactor. Reactant gas is then directed into the tapered gas space and over each wafer thereby improving deposition uniformity across each wafer and from wafer to wafer.
A reactor for the dual sided deposition of thin-film semiconductor material layers in the approximate thickness range of less than 1 micron to 100 microns on two surfaces of a plurality of wafers carried on a batch susceptor, said batch susceptor having a window frame structure allowing access to said two surfaces of said plurality of wafers for dual sided deposition on said two surfaces of said plurality of wafers, said reactor comprising a gas flow chamber having a tapered gas flow space between an interior wall of said chamber and said susceptor to improve the deposition uniformity across each wafer and from wafer to wafer, a plurality of shelving slots for positioning said interior wall of said chamber in shelving positions, said deposition of thin film semiconductor material on a wafer is an epitaxial thin film monocrystalline silicon deposition and trichlorosilane is used as the precursor for thin film monocrystalline silicon deposition.
A reactor for the dual sided deposition of thin film semiconductor material layers in the approximate thickness range of less than 1 micron to 100 microns on two surfaces of a plurality of wafers carried on a batch susceptor, said batch susceptor having a window frame structure allowing access to said two surfaces of said plurality of wafers for dual sided deposition on said two surfaces of said plurality of wafers, said reactor comprising a plurality of adjustable shelves allowing for various positioning of said susceptor to create a tapered gas flow space between an interior wall formed by at least one of said adjustable shelves and said susceptor for reducing the depletion of gas flow across said wafer, wherein a plurality of shelving slots are configured for positioning said interior wall of said chamber in shelving positions, and wherein said deposition of thin film semiconductor material on a wafer is an epitaxial thin film monocrystalline silicon deposition and trichlorosilane is used as the precursor for thin film monocrystalline silicon deposition.
Dependencies are inferred from the claim text.