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US 9,870,280 B2Granted
Apparatuses and methods for comparing a current representative of a number of failing memory cells
AssigneeMicron Technology, Inc.
InventorJae-Kwan Park
Life of this patent
Estimating the term…
Abstract
Apparatuses and methods for comparing a sense current representative of a number of failing memory cells of a group of memory cells and a reference current representative of a reference number of failing memory cells is provided. One such apparatus includes a comparator configured to receive the sense current and to receive the reference current. The comparator includes a sense current buffer configured to buffer the sense current and the comparator is further configured to provide an output signal having a logic level indicative of a result of the comparison.
Claims20
A system, comprising:
- a dynamic data cache configured to provide a sense current representative of a number of failing memory cells of a group of memory cells;
- a reference cell array configured to provide a reference current representative of a reference number of failing memory cells;
- and
- a comparator coupled to the dynamic data cache and the reference cell array, the comparator configured to compare the sense current and the reference current and provide an output signal indicative of the comparison.
1 more element
A system comprising:
- a memory array comprising a plurality of memory cells;
- a dynamic data cache configured to provide a sense current representative of a number of failing memory cells of the plurality of memory cells;
- and
- a comparator coupled to the dynamic data cache, the comparator configured to compare the sense current and a reference current and provide an output signal indicative of the comparison.
1 more element
Dependencies are inferred from the claim text.