Systems and methods for reducing effects of interference in input devices

An input device comprising:

• a plurality of sensor electrodes configured to capacitively detect input objects in a sensing region;
• and
• a processing system operatively coupled to the plurality of sensor electrodes, the processing system comprising circuitry configured to:
• operate the plurality of sensor electrodes to capture first resulting signals and second resulting signals;
• generate a first image of measured sensor values from the first resulting signals, the first image of measured sensor values having first errors associated with the first resulting signals along a first axis, wherein each of the first errors comprises an offset between one of the measured sensor values from the first resulting signals and a corresponding true sensor value;
• generate a first profile of measured sensor values from the second resulting signals, each of the measured sensor values from the second resulting signals corresponding to a different point along the first axis and having second errors;
• and
• produce a modified image of sensor values based on the first image of measured sensor values and the first profile of measured sensor values, the modified image of sensor values having errors that are smaller than the first errors.

A method of determining input in an input device, the method comprising:

• operating a plurality of sensor electrodes to capture first resulting signals and second resulting signals;
• generating a first image of measured sensor values from the first resulting signals, the first image of measured sensor values having first errors associated with the first resulting signals along a first axis, wherein each of the first errors comprises an offset between one of the measured sensor values from the first resulting signals and a corresponding true sensor value;
• generating a first profile of measured sensor values from the second resulting signals, each of the measured sensor values from the second resulting signals corresponding to a different point along the first axis and having second errors;
• producing a modified image of sensor values based on the first image of measured sensor values and the first profile of measured sensor values, the modified image of sensor values having errors that are smaller than the first errors;
• and
• determining positional information for an input object based on the modified image of sensor values.