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US 9,869,714 B2Granted
Integrated circuit test temperature control mechanism
AssigneeIntel Corporation
InventorsJohn C. Johnson, James G. Maveety, Abram M. Detofsky, James E. Neeb
Life of this patent
Estimating the term…
Abstract
A thermal controller includes a thermal control interface to receive test data from an automated test equipment (ATE) system and dynamically adjust a target setpoint temperature based on the data and a dynamic thermal controller to receive the target setpoint temperature from the thermal control interface and control a thermal actuator based on the target setpoint temperature.
Claims12
A test system comprising:
- an integrated circuit (IC) device;
- a thermal actuator coupled to the IC device to change a temperature of the IC device during testing;
- an automated test equipment (ATE) system coupled to the IC device and a thermal control interface, the (ATE) system is to send testing data for the IC device during testing of the thermal control interface and to dynamically adjust a target setpoint temperature for testing the IC device based on the testing data for the IC device;
- and
- a thermal controller, to control the temperature of the IC device during testing, the thermal controller including a dynamic thermal controller coupled to the thermal control interface and the thermal actuator to receive the target setpoint temperature from the thermal control interface and control the thermal actuator based on the target setpoint temperature.
2 more elements
A method comprising:
- changing, by a thermal actuator, temperature of an integrated circuit (IC) device during testing, wherein the thermal actuator is coupled to the IC device;
- dynamically adjusting, by a thermal control interface of an automated test equipment (ATE) system, a target setpoint temperature for testing the IC device based on testing data for the IC device, wherein the ATE system is coupled to the IC device and is to send the testing data for the IC device to the thermal control interface during testing;
- controlling, by a thermal controller, the temperature of the IC device during testing, the thermal controller including a dynamic thermal controller coupled to the thermal control interface and the thermal actuator to receive the target setpoint-temperature from the thermal control interface and control the. thermal actuator based on the target setpoint temperature.
Dependencies are inferred from the claim text.