US 9,869,645 B2 · System for non-destructive testing and method for processing data generated therein

Abstract

Systems and methods are described that reduce the amount of data that is transferred among the components of the system. In one embodiment, the testing system comprises a scanner device such as a computed-tomography (CT) scanner that generates a volumetric representation of a part-under-inspection. The testing system is further configured to identify a region of interest in the volumetric representation, wherein the region of interest may correspond to an area of the part-under-inspection where a defect or flaw may form. The testing system may further format the data of the volumetric representation so the resulting formatted volumetric representation comprises less data than the original volumetric representation.

Claims18

Dependent claims

A testing system, comprising:

a scanner device, wherein the scanner device comprises a computed tomography (CT) scanner;
and
a control unit coupled to the scanner device, the control unit operatively configured to generate one or more control signals to which the scanner device responds to generate a volumetric representation of a part-under-inspection,
wherein the control unit is further configured to locate a region of interest comprising a defect in the volumetric representation and a volume immediately proximate the defect in the volumetric representation and to generate a formatted volumetric representation having less data than the volumetric representation, generating the formatted volumetric representation comprising deleting data found outside the region of interest in the volumetric representation.

1 more element

Dependencies are inferred from the claim text.

System for non-destructive testing and method for processing data generated therein

Life of this patent

System for non-destructive testing and method for processing data generated therein

Life of this patent

Abstract

Claims18