Dual spectrometer
AssigneeSmiths Detection Inc.
InventorsDavid W. Schiering, Maxim Frayer, Peng Zou
Life of this patent
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AssigneeSmiths Detection Inc.
InventorsDavid W. Schiering, Maxim Frayer, Peng Zou
Estimating the term…
Systems and techniques for optical spectrometer detection using, for example, IR spectroscopy components and Raman spectroscopy components are described. For instance, a system includes a first electromagnetic radiation source configured to illuminate a sample with a first portion of electromagnetic radiation in a first region of the electromagnetic spectrum (e.g., an IR source) and a second electromagnetic radiation source configured to illuminate a sample with a second portion of electromagnetic radiation in a second substantially monochromatic region of the electromagnetic spectrum (e.g., a laser source). The system also includes a detector module configured to detect a sample constituent of a sample by analyzing a characteristic of electromagnetic radiation reflected from the sample associated with the first electromagnetic radiation source and a characteristic of electromagnetic radiation reflected from the sample associated with the second electromagnetic radiation source.
A spectroscopy system including an infrared spectroscopy portion and a Raman spectroscopy portion, the spectroscopy system comprising:
A method comprising:
A system comprising:
Dependencies are inferred from the claim text.