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US 9,869,537 B2Granted
Contact probe
AssigneeMitutoyo Corporation
InventorsKazuhiko Hidaka, Takeshi Yamamoto
Life of this patent
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Abstract
A contact probe includes a stylus, a spring, a magnetic body, and a permanent magnet. The stylus is displaceable in an X direction and a tip of the stylus makes contact with a measured object. A first end of the spring is fixated and a second end provides spring force along the X direction. A position of the magnetic body is fixated with respect to the stylus. The permanent magnet is arranged separated from the magnetic body so as to generate a magnetic force along the X direction between the magnetic body and the permanent magnet.
Claims11
A contact probe comprising:
- a stylus having a tip at a first end thereof and displaceable in a first direction such that the tip is contactable with an object to be measured;
- a spring having a fixed first end and a second end configured to apply force to the stylus along the first direction;
- a first magnet fixed to a second end of the stylus;
- and
- a second magnet separately provided from the first magnet so as to generate a magnetic force along the first direction between the first magnet and the second magnet.
2 more elements
Dependencies are inferred from the claim text.