Optical displacement measurement system, imaging condition optimization method, and imaging condition optimization program
AssigneeKeyence Corporation
InventorHiroyuki Satoyoshi
Life of this patent
Estimating the term…
Loading patent…
AssigneeKeyence Corporation
InventorHiroyuki Satoyoshi
Estimating the term…
There are provided an optical displacement measurement system, an imaging condition optimization method, and an imaging condition optimization program which facilitate setting of an optimal imaging condition. States of a plurality of imaging parameters for setting an imaging condition are set by an imaging setting unit. When the set state of any of the plurality of imaging parameters is changed, a plurality of pieces captured image data according to respective imaging conditions are generated by a light receiving unit. Profile data indicating a profile shape is generated by a profile generation unit based on each piece of generated captured image data. Based on each piece of generated profile data or captured image data corresponding to the profile data, a degree of reliability of a profile shape indicated by the profile data is calculated by a reliability calculation unit.
An optical displacement measurement system of an optical cutting method for measuring a profile shape of a measurement target by a triangulation method, the optical displacement measurement system comprising:
An imaging condition optimization method of an optical displacement measurement system of an optical cutting method for measuring a profile shape of a measurement target by a triangulation method, the optical displacement measurement system including a light projection unit for radiating light on the measurement target along one direction and a light receiving unit for receiving reflected light from the measurement target and for generating captured image data indicating an image of the measurement target based on an amount of received light, the imaging condition optimization method comprising the steps of:
A non-transitory storage medium comprising instructions which when executed causes a processing device to optimize an imaging condition of an optical displacement measurement system of an optical cutting method for measuring a profile shape of a measurement target by a triangulation method, the optical displacement measurement system including a light projection unit for radiating light on the measurement target along one direction and a light receiving unit for receiving reflected light from the measurement target and for generating captured image data indicating an image of the measurement target based on an amount of received light, the non-transitory storage medium causing the processing device to execute the processes of:
Dependencies are inferred from the claim text.