Method for testing a multiple-input and multiple-output device and test system
AssigneeRohde & Schwarz GmbH & Co. KG
InventorHendrik Bartko
Life of this patent
Estimating the term…
Loading patent…
AssigneeRohde & Schwarz GmbH & Co. KG
InventorHendrik Bartko
Estimating the term…
A method for testing a multiple-input and multiple-output device is described, said device comprising at least two receiving antennas. A first test signal is transmitted via a first transmission antenna. The first test signal is measured via each receiving antenna of said device. At least a second test signal is transmitted via a second transmission antenna. The second test signal is measured via each receiving antenna of said device. Further transmitting signals are transmitted via the transmission antennas in pairs wherein a phase difference is set between the phases of said transmitting signals transmitted via the pair of transmission antennas. Measuring the further transmitting signals via each receiving antenna of said device. A channel matrix of said device is determined. Furthermore, a test system is described.
A method of using a test system to test a multiple-input and multiple-output device, said device comprising at least two receiving antennas, comprising the following steps:
Dependencies are inferred from the claim text.