A method for recovering insulation of an organic thin film transistor that includes a source electrode and a drain electrode disposed on a substrate, a semiconductor pattern electrically connected to the source electrode and the drain electrode, a gate insulation layer electrically insulating the semiconductor pattern, and a gate electrode insulated with the semiconductor pattern having the gate insulation layer provided in between, the method comprising:
- etching a top electrode on the gate insulation layer;
- heat treating the top electrode-removed gate insulation layer;
- and
- forming the top electrode again on the heat-treated gate insulation layer,
- wherein the gate insulation layer is a sulfur copolymer thin film,
- wherein the sulfur copolymer thin film has more disulfide bonds than carbon-sulfur bonds, and
- wherein the top electrode includes at least any one of the source electrode, the drain electrode and the gate electrode.