Surface-coated cutting tool
AssigneeSumitomo Electric Hardmetal Corp.
InventorsHideaki Kanaoka, Shinya Imamura, Anongsack Paseuth, Takanori Detani
Life of this patent
Estimating the term…
Abstract
A surface-coated cutting tool includes a base material and a coating formed on the base material. The coating includes an α-Al2O3 layer. The α-Al2O3 layer contains a plurality of α-Al2O3 crystal grains and a plurality of κ-Al2O3 crystal grains, and has a TC(006) of more than 5 in a texture coefficient TC(hkl). A ratio of Cκ to a sum of Cα and Cκ: [Cκ/(Cα+Cκ)×100](%) is 0.05 to 7%, where Cα is a total number of peak counts of the α-Al2O3 crystal grains obtained from measurement data of x-ray diffraction for the coating, and Cκ is a total number of peak counts of the κ-Al2O3 crystal grains obtained from the measurement data of the x-ray diffraction for the coating.
Claims4
A surface-coated cutting tool comprising a base material and a coating formed on the base material,
- the coating including an α-Al2O3 layer,
- the α-Al2O3 layer containing a plurality of α-Al2O3 crystal grains and a plurality of κ-Al2O3 crystal grains, and having a TC(006) of more than 5 in a texture coefficient TC(hkl),
- a ratio of Cκ to a sum of Cα and Cκ:
- [Cκ/(Cα+Cκ)×100](%) being 0.05 to 7%, where Cα is a total number of peak counts of the α-Al2O3 crystal grains obtained from measurement data of x-ray diffraction for the coating, and Cκ is a total number of peak counts of the κ-Al2O3 crystal grains obtained from the measurement data of the x-ray diffraction for the coating,
- in the α-Al2O3 layer, an area ratio X of the κ-Al2O3 crystal grains to all Al2O3 crystal grains in a measurement field of view being 0.1 to 20%, the measurement field of view being derived from an analysis with an electron backscatter diffraction apparatus for a region from a front surface of the α-Al2O3 layer inward to a depth of 1 μm, and
- in the α-Al2O3 layer, an area ratio Y of the κ-Al2O3 crystal grains to all Al2O3 crystal grains in a measurement field of view being smaller than the area ratio X, the measurement field of view being derived from an analysis with the electron backscatter diffraction apparatus for a region beyond the region from the front surface of the α-Al2O3 layer inward to the depth of 1 μm.
Dependencies are inferred from the claim text.