Semiconductor device and method for manufacturing same
AssigneeToshiba Memory Corporation
InventorYuji Setta
Life of this patent
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AssigneeToshiba Memory Corporation
InventorYuji Setta
Estimating the term…
According to one embodiment, the circuit portion includes a transistor provided at a region separated from the first stacked portion in the substrate. The second stacked portion is provided above the circuit portion. The second stacked portion includes a plurality of first layers and a plurality of second layers. The first layers and the second layers include a first layer and a second layer stacked alternately. An insulating layer is provided above the circuit portion and provided above the substrate between the first stacked portion and the second stacked portion. A height of an uppermost first layer of the second stacked portion from a surface of the substrate is substantially equal to a height of an uppermost electrode layer of the first stacked portion from the surface of the substrate, or is higher than the height of the uppermost electrode layer.
A semiconductor device, comprising:
Dependencies are inferred from the claim text.