Rupture control device and semiconductor device to improve yield
AssigneeSK hynix Inc.
InventorKwi Dong Kim
Life of this patent
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Abstract
A rupture control device may include an address control circuit configured to generate a rupture address in response to a first rupture command signal, a rupture mask signal and an external address, wherein the rupture address is generated according to whether the rupture mask signal is activated, and wherein an address and fuse data are compared, and a rupture mask signal indicating whether a fuse is ruptured is determined. Further, a fuse array configured to perform a rupture operation in response to the rupture address when a rupture enable signal is activated, and output the fuse data in response to a read enable signal.
Claims16
A rupture control device comprising:
- an address control circuit configured to generate a rupture address in response to a first rupture command signal, a rupture mask signal and an external address, wherein the rupture address is generated according to whether the rupture mask signal is activated, and wherein an address and fuse data are compared, and the rupture mask signal indicating whether a fuse is ruptured is determined;
- and
- a fuse array configured to perform a rupture operation in response to the rupture address when a rupture enable signal is activated, and output the fuse data in response to a read enable signal,
- wherein the address control circuit comprises:
- a counter control circuit configured to output a counter control signal in response to the first rupture command signal and the rupture mask signal, and selectively activate the counter control signal according to whether the rupture mask signal is activated;
- a rupture counter configured to output a counting signal in response to the counter control signal;
- a rupture address generation circuit configured to generate the rupture address in response to the counting signal;
- and
- a rupture control circuit configured to output the rupture enable signal in response to the rupture mask signal and a second rupture command signal,
- wherein the rupture control circuit deactivates the rupture enable signal when the rupture mask signal is activated, regardless of the second rupture command signal.
A semiconductor device comprising:
- a rupture control device configured to output fuse data in response to a read enable signal, fix a counting signal during an inactive period of a rupture mask signal indicating whether a fuse is ruptured, and consecutively perform a preset number of rupture operations on the same rupture address;
- and
- a normal cell array configured to perform a redundancy operation for a fail address during a repair operation in response to the fuse data,
- wherein the rupture control device comprises:
- an address control circuit configured to generate the rupture address in response to a first rupture command signal, the rupture mask signal and an external address, wherein the rupture address is generated according to whether the rupture mask signal is activated,
- wherein the address control circuit comprises:
- a counter control circuit configured to output a counter control signal in response to the first rupture command signal and the rupture mask signal, and selectively activate the counter control signal according to whether the rupture mask signal is activated;
- a rupture counter configured to output the counting signal in response to the counter control signal;
- a rupture address generation circuit configured to generate the rupture address in response to the counting signal;
- and
- a rupture control circuit configured to output the rupture enable signal in response to the rupture mask signal and a second rupture command signal,
- wherein the rupture control circuit deactivates the rupture enable signal when the rupture mask signal is activated, regardless of the second rupture command signal.
Dependencies are inferred from the claim text.