Optimizing fuseROM usage for memory repair

An integrated circuit comprising:

• one or more memory wrappers, each memory wrapper configured to store a bypass data, the bypass data configured to indicate a defective memory wrapper of the one or more memory wrappers;
• a fuseROM controller coupled to the one or more memory wrappers;
• and
• a fuseROM coupled to the fuseROM controller, wherein the fuseROM comprises a memory data storage configured to store a repair data corresponding to each defective memory wrapper of the one or more memory wrappers, and a memory bypass storage configured to store the bypass data corresponding to each memory wrapper of the one or more memory wrappers.

An integrated circuit comprising:

• one or more memory wrappers, each memory wrapper comprising a fuse register and a bypass register, the bypass register configured to store a bypass data which indicates a defective memory wrapper of the one or more memory wrappers;
• and
• a BISR (built-in self-repair) controller coupled to each memory wrapper of the one or more memory wrappers, wherein the BISR controller is configured to self repair each memory wrapper which further comprises:
• store the bypass data in the bypass register of each memory wrapper of the one or more memory wrappers;
• and
• store a repair data in the fuse register of each defective memory wrapper of the one or more memory wrappers.

A method of repairing one or more memory wrapper in an integrated circuit comprising:

• configuring a memory data chain to link each memory wrapper of the one or more memory wrappers;
• loading a bypass data corresponding to each memory wrapper in a memory bypass chain, wherein the bypass data is configured to indicate a defective memory wrapper of the one or more of memory wrappers;
• and
• reconfiguring the memory data chain to link each defective memory wrapper of the one or more memory wrappers responsive to the bypass data loaded in the memory bypass chain.

A method of self repairing one or more memory wrappers on an integrated circuit comprising:

• generating a bypass data for each memory wrapper of the one or more memory wrappers, wherein the bypass data is configured to indicate a defective memory wrapper;
• generating a repair data for each defective memory wrapper of the one or more memory wrappers;
• blowing one or more fuses of a fuseROM to store the repair data corresponding to each defective memory wrapper in a memory data storage of the fuseROM;
• and
• storing the bypass data corresponding to each memory wrapper in a memory bypass storage of the fuseROM.