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AssigneeSamsung Display Co., Ltd.
InventorsMyoung-Ho Kwon, Chang-Jin Lee, Chang-Kil Lee, Tae-Sik Kim
Estimating the term…
A method of detecting an error of a multi-time programmable (MTP) operation in which each gamma-offset and each header-bit at predetermined reference gray-levels are written in a MTP memory device while the MTP operation is performed on a pixel circuit, the each header-bit indicating whether or not the each gamma-offset is written in the MTP memory device, and it is detected whether or not the MTP operation is performed on the pixel circuit based on a logical operation between the header-bits at the predetermined reference gray-levels read from the MTP memory device when the MTP operation is finished on the pixel circuit.
A method of detecting an error of a multi-time programmable (MTP) operation in an organic light emitting display device having a plurality of pixel circuits, the method comprising:
A method of detecting an error of a multi-time programmable (MTP) operation in an organic light emitting display device that includes a plurality of pixel circuits, the method comprising:
A method of detecting an error of a multi-time programmable (MTP) operation on an organic light emitting display device, the method comprising:
An organic light emitting display device, comprising:
Dependencies are inferred from the claim text.
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Error or fault detection not based on redundancy: by bit configuration check, e.g. of formats or tags
The processing taking place on a specific hardware platform or in a specific software environment: in functional embedded systems, i.e. in a data…
Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes: electronic inspection or…
Semiconductive, e.g. using light-emitting diodes [LED]: organic, e.g. using organic light-emitting diodes [OLED]
About 7 years 2 months of term left · ends 24 Dec 2033 (estimated)
This application makes reference to, incorporates the same herein, and claims all benefits accruing under 35 U.S.C. §119 from an application earlier filed in the Korean Intellectual Property Office on 28 Dec. 2012 and there duly assigned Serial No. 10-2012-0156337.
1. Field of the Invention
Example embodiments relate generally to a display device.
A more complete appreciation of the invention, and many of the attendant advantages thereof, will be readily apparent as the same becomes better understood by reference to the following detailed description when considered in conjunction with the accompanying drawings, in which like reference symbols indicate the same or similar components, wherein:
FIG. 1 is a flow chart illustrating a method of detecting an error of a multi-time programmable (MTP) operation according to example embodiments.
FIG. 2 is a diagram illustrating gamma-offsets and header-bits that are written in an MTP memory device when a method of FIG. 1 is performed.
Various example embodiments will be described more fully hereinafter with reference to the accompanying drawings, in which some example embodiments are shown. The present inventive concept may, however, be embodied in many different forms and should not be construed as limited to the example embodiments set forth herein. Rather, these example embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the present inventive concept to those skilled in the art. In the drawings, the sizes and relative sizes of layers and regions may be exaggerated for clarity. Like numerals refer to like elements throughout.
It will be understood that, although the terms first, second, third etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are used to distinguish one element from another. Thus, a first element discussed below could be termed a second element without departing from the teachings of the present inventive concept. As used herein, the term “and/or” includes any and all combinations of one or more of the associated listed items.
It will be understood that when an element is referred to as being “connected” or “coupled” to another element, it can be directly connected or coupled to the other element or intervening elements may be present. In contrast, when an element is referred to as being “directly connected” or “directly coupled” to another element, there are no intervening elements present. Other words used to describe the relationship between elements should be interpreted in a like fashion (e.g., “between” versus “directly between,” “adjacent” versus “directly adjacent,” etc.).