Semiconductor device

A semiconductor device comprising:

• a movable portion;
• a first scan line driver circuit;
• a second scan line driver circuit;
• a signal line control circuit;
• and
• a control portion,
• wherein the movable portion includes a first region and a second region,
• wherein the first region includes a plurality of transistors arranged in a matrix,
• wherein the second region includes a plurality of transistors arranged in a matrix,
• wherein the plurality of transistors in the first region is electrically connected to the signal line control circuit,
• wherein the plurality of transistors in the second region is electrically connected to the signal line control circuit,
• wherein the first scan line driver circuit includes first to k-th shift registers,
• wherein k is an integer of two or more,
• wherein the second scan line driver circuit includes (k+1)th to h-th shift registers,
• wherein h is an integer of four or more, where (k+1)<h,
• wherein an output terminal of the first scan line driver circuits electrically connected to an input terminal of the second scan line driver circuit through a switch such that an output from the output terminal of the first scan line driver circuit is input to the input terminal of the second scan line driver circuit through the switch,
• wherein the first scan line driver circuit is configured to drive a plurality of transistors included in the first region,
• wherein the second scan line driver circuit is configured to drive a plurality of transistors included in the second region,
• wherein the control portion outputs a start pulse to an input terminal of the first scan line driver circuit when the movable portion is in a first state and a start pulse to the input terminal of the second scan line driver circuit when the movable portion is in a second state, and
• wherein the movable portion is foldable between the first region and the second region.

A semiconductor device comprising:

• a movable portion;
• a first scan line driver circuit;
• a second scan line driver circuit;
• a third scan line driver circuit;
• a signal line control circuit;
• and
• a control portion,
• wherein the movable portion includes a first region, a second region, and a third region,
• wherein the first region includes a plurality of transistors arranged in a matrix,
• wherein the second region includes a plurality of transistors arranged in a matrix,
• wherein the third region includes a plurality of transistors arranged in a matrix,
• wherein the plurality of transistors in the first region is electrically connected to the signal line control circuit,
• wherein the plurality of transistors in the second region is electrically connected to the signal line control circuit,
• wherein the plurality of transistors in the third region is electrically connected to the signal line control circuit,
• wherein the first scan line driver circuit includes first to k-th shift registers, wherein k is an integer of two or more,
• wherein the second scan line driver circuit includes (k+1)th to h-th shift registers,
• wherein h is an integer of four or more, where (k+1)<h,
• wherein the third scan line driver circuit includes (h+1)th to t-th shift registers,
• wherein t is an integer of six or more, where (h+1)<t,
• wherein an output terminal of the first scan line driver circuit electrically connected to an input terminal of the second scan line driver circuit through a first switch such that an output from the output terminal of the first scan line driver circuit is input to the input terminal of the second scan line driver circuit through the first switch,
• wherein an output terminal of the second scan line driver circuit electrically connected to an input terminal of the second scan line driver circuit through a second switch such that an output from the output terminal of the second scan line driver circuit is input to the input terminal of the second scan line driver circuit through the second switch,
• wherein the first scan line driver circuit is configured to drive a plurality of transistors included in the first region,
• wherein the second scan line driver circuit is configured to drive a plurality of transistors included in the second region,
• wherein the third scan line driver circuit is configured to drive a plurality of transistors included in the third region,
• wherein the control portion is configured to turn on the first switch and supply a start pulse to the first scan line driver circuit, is configured to turn off the first switch, turn on the second switch, and supply a start pulse to the second scan line driver circuit, and is configured to turn off the first and the second switches and supply a start pulse to the third scan line driver circuit, and
• wherein the control portion is configured to turn on the first switch and supply a start pulse to the first scan line driver circuit is configured to turn off the first switch, turn on the second switch, and supply a start pulse to the second scan line driver circuit, and is configured to turn off the first and the second switches and supply a start pulse to the third scan line driver circuit, and
• wherein the movable portion is foldable between the first region and the second region and between the second region and the third region.