Systems and methods mitigating temperature dependence of circuitry in electronic devices
AssigneeAnalog Test Engines
InventorJeffrey Allen King
Life of this patent
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Abstract
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
Claims8
A method of using an electronic tester to perform a test on an electronic test device under test (DUT), the electronic tester comprising a current measurement unit configured to generate an electrical measurement signal having a value indicative of a current, a memory, a temperature sensor, and a processor configured to compare the electrical measurement signal with a test limit to determine a result of the test of the test DUT, the method comprising:
- with the current measurement unit, applying a first current to a calibration DUT electrically connected with the current measurement unit;
- by using at least one of:
- an oven, a cooler, the electronic tester, setting a temperature of the electronic tester to each of multiple temperature values;
- with the processor, generating an electronic measurement signal representing the applied first current for each of the temperatures, wherein the value of each of the electronic measurement signals is at least partly a result of a sensitivity of the current measurement unit to the temperatures;
- with the memory, electronically storing a measurement value for each of the electronic measurement signals;
- with the processor, based on the stored measurement values and the temperatures, determining a mathematical relationship between the applied first current, the stored measurement values, and the temperatures, wherein the mathematical relationship represents the sensitivity of the current measurement unit to the temperatures;
- with the processor, based on the mathematical relationship, generating a compensation function configured to enable the processor to calculate a future compensated current value based on a future electronic measurement signal generated with the current measurement unit at a future temperature;
- with the current measurement unit, applying a voltage to the test DUT;
- with the current measurement unit, generating the test DUT electronic measurement signal representing a current applied to the test DUT by the electronic tester;
- with the processor, receiving the test DUT electronic measurement signal generated with the current measurement unit;
- with the temperature sensor, providing a temperature signal to the processor, wherein the temperature signal indicates a temperature of the electronic tester;
- with the processor using the compensation function from the calibration DUT, calculating a compensated current value representing the current applied to the test DUT by the electronic tester, wherein the compensated current value is calculated based on the test DUT electronic measurement signal and the temperature signal;
- and
- with the processor comparing the compensated current value with a test limit to determine a result of the test of the test DUT.
Dependencies are inferred from the claim text.