Structure analyzing device and a structure analyzing method

A structure analyzing device, comprising:

• a plurality of vibration detecting sensors configured to detect a vibration of a structure;
• and
• a processor configured to analyze an output signal of the plurality of vibration detecting sensors, wherein
• the plurality of vibration detecting sensors are arranged respectively at locations different from each other in the structure,
• the processor analyzes distribution of change in the structure by comparing a measured value of a resonant sharpness Q, which is calculated by use of the following formula (1), with a standard value of the resonant sharpness Q, and comparing the measured value of the resonant sharpness Q of each sensor in high order resonant frequency,
• Q=f/Δf (1)
• where f is a resonant frequency of the structure, and Δf is a full width at half maximum, and
• the processor identifies a degradation position of the structure based on a result of a comparison with respect to the resonant sharpness Q of each sensor in the high order resonant frequency.