Systems and methods for monitoring components

A system for monitoring a component, the component having an exterior surface, the system comprising:

• an imaging device for obtaining images of a surface feature configured on the exterior surface of the component;
• and
• a processor in operable communication with the imaging device, the processor configured for:
• performing a first analysis of a first image of the surface feature, the first image obtained by the imaging device;
• adjusting a viewing parameter of the imaging device when a predetermined first analysis threshold for the first image is unsatisfied;
• performing a subsequent first analysis of a second image of the surface feature, the second image obtained by the imaging device;
• adjusting a distance between the imaging device and the surface feature when the predetermined first analysis threshold for the second image is unsatisfied;
• and
• performing a second analysis of a third image of the surface feature, the third image obtained by the imaging device.

A method for monitoring a component, the component having an exterior surface, the method comprising:

• performing a first analysis of a first image of a surface feature configured on the exterior surface of the component, the first image obtained by an imaging device, wherein the first analysis is a binary pixel analysis;
• adjusting a viewing parameter of the imaging device when a predetermined first analysis threshold for the first image is unsatisfied, wherein the predetermined first analysis threshold is a first width threshold for an edge of the surface feature;
• performing a subsequent first analysis of a second image of the surface feature, the second image obtained by the imaging device;
• adjusting a distance between the imaging device and the surface feature when the predetermined first analysis threshold for the second image is unsatisfied;
• and
• performing a second analysis of a third image of the surface feature, the third image obtained by the imaging device.

A system for monitoring a component, the component having an exterior surface, the system comprising:

• an imaging device for obtaining images of a surface feature configured on the exterior surface of the component;
• and
• a processor in operable communication with the imaging device, the processor configured for:
• performing a first analysis of a first image of the surface feature, the first image obtained by the imaging device, wherein the first analysis is a binary pixel analysis;
• adjusting a viewing parameter of the imaging device when a predetermined first analysis threshold for the first image is unsatisfied, wherein the predetermined first analysis threshold is a first width threshold for an edge of the surface feature;
• performing a subsequent first analysis of a second image of the surface feature, the second image obtained by the imaging device;
• adjusting a distance between the imaging device and the surface feature when the predetermined first analysis threshold for the second image is unsatisfied;
• and
• performing a second analysis of a third image of the surface feature, the third image obtained by the imaging device.

A method for monitoring a component, the component having an exterior surface, the method comprising:

• performing a first analysis of a first image of a surface feature configured on the exterior surface of the component, the first image obtained by an imaging device;
• adjusting a viewing parameter of the imaging device when a predetermined first analysis threshold for the first image is unsatisfied;
• performing a subsequent first analysis of a second image of the surface feature, the second image obtained by the imaging device;
• adjusting a distance between the imaging device and the surface feature when the predetermined first analysis threshold for the second image is unsatisfied;
• performing a second analysis of a third image of the surface feature, the third image obtained by the imaging device, wherein the second analysis is a 256 bit-per-pixel greyscale pixel analysis;
• and
• adjusting a viewing parameter of the imaging device when a predetermined second analysis threshold for the third image is unsatisfied, wherein the predetermined second analysis threshold is a second width threshold for an edge of the surface feature.

A system for monitoring a component, the component having an exterior surface, the system comprising:

• an imaging device for obtaining images of a surface feature configured on the exterior surface of the component;
• and
• a processor in operable communication with the imaging device, the processor configured for:
• performing a first analysis of a first image of the surface feature, the first image obtained by the imaging device;
• adjusting a viewing parameter of the imaging device when a predetermined first analysis threshold for the first image is unsatisfied;
• performing a subsequent first analysis of a second image of the surface feature, the second image obtained by the imaging device;
• adjusting a distance between the imaging device and the surface feature when the predetermined first analysis threshold for the second image is unsatisfied;
• performing a second analysis of a third image of the surface feature, the third image obtained by the imaging device, wherein the second analysis is a 256 bit-per-pixel greyscale pixel analysis;
• adjusting a viewing parameter of the imaging device when a predetermined second analysis threshold for the third image is unsatisfied, wherein the predetermined second analysis threshold is a second width threshold for an edge of the surface feature.