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US 9,810,792 B2Granted
Crystal material, radiation detector, imaging apparatus, nondestructive inspection apparatus, and lighting apparatus
AssigneeTohoku University
InventorsAkira Yoshikawa, Shunsuke Kurosawa, Yuui Yokota, Yasuhiro Shoji, Akira Suzuki, Toetsu Shishido
Life of this patent
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Abstract
A crystal material represented by a general formula (1): (Gd1-x-y-zLaxMEyREz)2MM2O7 (1), where ME is at least one selected from Y, Yb, Sc, and Lu; RE is Ce or Pr; MM is at least one selected from Si and Ge; and ranges of x, y, and z are represented by the following (i): (i) 0.0≦x+y+z<1.0, 0.05≦x+z<1.0, 0.0≦y<1.0, and 0.0001≦z<0.05 (where, when RE is Ce, y=0 is an exception).
Claims13
A crystal material represented by a general formula (1):
- (Gd1-x-y-zLaxMEyREz)2MM2O7 (1)
- where ME is at least one selected from Y, Sc, and Lu;
- RE is at least one selected from Ce or Pr;
- MM includes at least Si and Ge;
- and ranges of x, y, and z are represented by the following (i):
- (i) 0.0≦x+y+z<1.0, 0.05≦x+z<1.0, 0.0≦y<1.0, and 0.0001≦z<0.05 (where, when RE is Ce, y=0 is an exception).
3 more elements
Dependencies are inferred from the claim text.