Measuring apparatus and support mechanism of columnar work piece
AssigneeMitutoyo Corporation
InventorsHirotada Anzai, Tomomitsu Sugawara, Monya Fujiwara
Life of this patent
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AssigneeMitutoyo Corporation
InventorsHirotada Anzai, Tomomitsu Sugawara, Monya Fujiwara
Estimating the term…
A measuring apparatus includes a first end support portion supporting a first end of the columnar work piece; a second end support portion supporting a second end of the columnar work piece; and a measurement device having a probe which measures the columnar work piece supported by the first end support portion and the second end support portion. The first end support portion includes a first end support body attachably and detachably fitting into a centering aperture of the first end of the columnar work piece. The first end support body includes at least two cut-outs, and in a state where the first end support body is fitted into the centering aperture, an interior surface of the centering aperture is visible to the exterior through the cut-outs. The measurement device inserts the probe into the centering aperture through the cut-outs and measures the interior surface of the centering aperture.
A measuring apparatus measuring an elongated, columnar work piece having a centering aperture at two ends, the measuring apparatus comprising:
A support mechanism of a columnar work piece supporting an elongated, columnar work piece having a centering aperture at two ends, the support mechanism comprising:
Dependencies are inferred from the claim text.