Integrated RF MEMS on ATE loadboards for smart self RF matching
AssigneeAdvantest Corporation
InventorsXin Ping Zeng, Hui Yu, Keith Schaub, Liang Ge, Heng Huat Goh
Life of this patent
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Abstract
In a testing device, a method for implementing automatic RF port testing. The method includes attaching a device under test having a plurality of RF pins to a load board, dynamically tuning a plurality of RF ports of the load board to the plurality of RF pins, and automatically matching the plurality of RF ports to the plurality of RF pins with respect to impedance. The method further includes implementing an RF port testing process on the device under test.
Claims18
A method for implementing automatic RF port testing in an automated testing equipment, the method comprising:
- subsequent to a device under test being coupled to a load board of the automated testing equipment, dynamically tuning impedance at a plurality of RF ports of the load board to a plurality of RF pins of the device under test through an impedance matching device, wherein the impedance matching device is an integral component of the load board;
- automatically matching the plurality of RF ports to the plurality of RF pins with respect to impedance;
- and
- implementing an RF port testing process on the device under test.
A non-transitory computer readable memory having computer readable code which when executed by a processor causes the processor to implement a method for implementing automatic RF port testing, the method comprising:
- after a device under test is coupled to a load board of an automated testing equipment, dynamically tuning impedance at a plurality of RF ports of the load board to a plurality of RF pins of the device under test through an impedance matching device that is an integral component of the load board;
- automatically matching the plurality of RF ports to the plurality of RF pins with respect to impedance;
- and
- implementing an RF port testing process on the device under test.
An automated test system comprising:
- an RF measurement device;
- a load board comprising:
- a plurality of RF ports configured to couple a device under test with the automated test equipment through a plurality of RF pins of the device under test:
- an impedance matching device coupled to the plurality of RF ports;
- a processor coupled to the load board;
- and
- memory coupled to the processor and comprising instructions that, when executed by the processor, cause the automated test system to implement a method of:
- dynamically tuning the impedance matching device to automatically match impedance at the plurality of RF ports to the plurality of RF pins;
- and
- implementing an RF port testing process on the device under test.
Dependencies are inferred from the claim text.