Differential current measurements to determine ion current in the presence of leakage current
AssigneeMicrochip Technology Incorporated
InventorsJoseph Julicher, Keith Curtis, Paul N. Katz
Life of this patent
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AssigneeMicrochip Technology Incorporated
InventorsJoseph Julicher, Keith Curtis, Paul N. Katz
Estimating the term…
An ion chamber provides a current representative of its characteristics as affected by external conditions, e.g., clean air or smoke. A direct current (DC) voltage is applied to the ion chamber at a first polarity and the resulting current through the ion chamber and parasitic leakage current is measured at the first polarity, then the DC voltage is applied to the ion chamber at a second polarity opposite the first polarity, and the resulting current through the ion chamber and parasitic leakage current is measured at the second polarity. Since substantially no current flows through the ion chamber at the second polarity, the common mode parasitic leakage current contribution may be removed from the total current measurement by subtracting the current measured at the second polarity from the current measured at the first polarity, resulting in just the current through the ion chamber.
An apparatus for detecting smoke, comprising:
Dependencies are inferred from the claim text.