Defect detection device and production system

A production system comprising:

• a defect detection device comprising:
• an imaging device configured to image an image of an inspection object;
• a binarization processing unit configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image;
• a ratio calculation unit configured to calculate a first ratio of the second size to the first size;
• a depth determination unit configured to determine a depth of the defect depending on the first ratio;
• and
• a volume calculation unit configured to calculate a volume of the defect depending on the depth of the defect determined, and calculate a sum of volumes of all defects in the image, and
• a processing device configured to arrange a processing condition for the inspection object according to the sum of the volumes of the all defects.