State estimation apparatus, state estimation method, and integrated circuit
AssigneesMegaChips Corporation, Kyushu Institute of Technology
InventorsNorikazu Ikoma, Hiromu Hasegawa
Life of this patent
Estimating the term…
Loading patent…
AssigneesMegaChips Corporation, Kyushu Institute of Technology
InventorsNorikazu Ikoma, Hiromu Hasegawa
Estimating the term…
Provided is a state estimation apparatus that enables more accurate and robust detection and tracking of an object by obtaining a plurality of sets of observation data for a tracking target object and estimating the internal state of the object using a plurality of likelihoods calculated from the obtained sets of observation data. The state estimation apparatus obtains first observation data and second observation data, each of which is composed of a plurality of pieces of observation data, and obtains possibility measurement data and necessity measurement data from the obtained plurality of pieces of observation data. In the state estimation apparatus, a likelihood obtaining unit obtains a first likelihood wp and a second likelihood wn from the possibility measurement data and the necessity measurement data. Using the obtained first likelihood wp and second likelihood wn enables the internal state of the object to be estimated.
A state estimation apparatus for estimating an internal state of an observation target, the apparatus comprising:
A state estimation method for estimating an internal state of an observation target, the state estimation method comprising:
An integrated circuit for estimating an internal state of an observation target, the integrated circuit comprising:
Dependencies are inferred from the claim text.