Internal voltage monitoring for integrated circuit devices
AssigneeXilinx, Inc.
InventorAustin H. Lesea
Life of this patent
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AssigneeXilinx, Inc.
InventorAustin H. Lesea
Estimating the term…
An integrated circuit (IC) is located on an IC chip and includes an integrated voltage regulator circuit that provides an internal supply voltage to the IC. A test mode signal can be received from an external pin of the IC chip. In response to the test mode signal, the IC can enter a test mode where the internal supply voltage is provided to components of the IC. Also in the test mode, voltage characteristics of the internal supply voltage are measured to produce an analog held value. The measurements occur in an analog domain and over a plurality of sample-and-hold windows. Upon completion of a measurement window, the analog held is converted to a digital value. The digital value is then stored in a memory circuit. The digital value is provided from the memory circuit to a reader device external to the IC.
A method for testing an integrated circuit (IC) located on an IC chip and that includes an integrated voltage regulator circuit that provides an internal supply voltage to the IC, the method comprising:
A system comprising:
A system comprising:
Dependencies are inferred from the claim text.