Alloy material, contact probe, and connection terminal

A conductive contact probe contacting with each of contact targets at both ends in a longitudinal direction,

• at least part of which is formed using an alloy material, consisting of:
• a composition containing 17 at % to 25 at % of silver (Ag), 30 at % to 45 at % of palladium (Pd), and 30 at % to 53 at % of copper (Cu) in a composition range of a ternary alloy of Ag, Pd, and Cu;
• and
• at least one of manganese (Mn), tin (Sn), silicon (Si), antimony (Sb), titanium (Ti) and magnesium (Mg) added to the composition in a range of 4.5 at % or less,
• wherein the Mn in a range of 0.5 at % to 3.5 at %, the Sn in a range of 1 at % to 2 at %, the Si in a range of 0.5 at % to 2 at %, the Sb in a range of 0.5 at % to 3 at %, the Ti in a range of 0.5 at % to 2 at %, and the Mg in a range of 0.5 at % to 3.5 at % are added to the composition, and
• one of iridium (Ir), ruthenium (Ru) and a combination of Ir and Ru is further added in an amount of 0.01 at % to 0.05 at %.

A conductive connection terminal contacting with each of contact targets at both ends in a longitudinal direction,

• at least part of which is formed using an alloy material, consisting of:
• a composition containing 17 at % to 25 at % of silver (Ag), 30 at % to 45 at % of palladium (Pd), and 30 at % to 53 at % of copper (Cu) in a composition range of a ternary alloy of Ag, Pd, and Cu;
• and
• at least one of manganese (Mn), tin (Sn), silicon (Si), antimony (Sb), titanium (Ti) and magnesium (Mg) added to the composition in a range of 4.5 at % or less,
• wherein the Mn in a range of 0.5 at % to 3.5 at %, the Sn in a range of 1 at % to 2 at %, the Si in a range of 0.5 at % to 2 at %, the Sb in a range of 0.5 at % to 3 at %, the Ti in a range of 0.5 at % to 2 at %, and the Mg in a range of 0.5 at % to 3.5 at % are added to the composition, and
• one of iridium (Ir), ruthenium (Ru) and a combination of Ir and Ru is further added in an amount of 0.01 at % to 0.05 at %.

A conductive contact probe contacting with each of contact targets at both ends in a longitudinal direction,

• at least part of which is formed using an alloy material, comprising:
• a composition containing 17 at % to 25 at % of silver (Ag), 30 at % to 45 at % of palladium (Pd), and 30 at % to 53 at % of copper (Cu) in a composition range of a ternary alloy of Ag, Pd, and Cu;
• and
• at least one of manganese (Mn), tin (Sn), silicon (Si), antimony (Sb), titanium (Ti) and magnesium (Mg) added to the composition in a range of 4.5 at % or less,
• wherein the Mn in a range of 0.5 at % to 3.5 at %, the Sn in a range of 1 at % to 2 at %, the Si in a range of 0.5 at % to 2 at %, the Sb in a range of 0.5 at % to 3 at %, the Ti in a range of 0.5 at % to 2 at %, and the Mg in a range of 0.5 at % to 3.5 at % are added to the composition, and
• one of iridium (Ir), ruthenium (Ru) and a combination of Ir and Ru is further added in an amount of 0.01 at % to 0.05 at %, and
• the conductive contact probe, comprising:
• a first conductive plunger contacting with one of contact targets at one end;
• a second conductive plunger contacting with other one of the contact targets at the other end;
• and
• a coil spring arranged between the first plunger and the second plunger so as to elastically connect the first and the second plungers with each other,
• wherein at least one of the first plunger, the second plunger, and the coil spring consists of the alloy material.