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US 9,804,195 B2Granted
HF measuring probe contacting assembly
AssigneeRosenberger Hochrequenztechnik GmbH & Co. KG
InventorRoland Neuhauser
Life of this patent
Estimating the term…
Abstract
A contacting assembly, in particular an HF measuring tip, having a carrier, on which a conductor structure is arranged, wherein the conductor structure has, at a contact end, at least one contact element protruding from the carrier for electrically contacting at least one contact point of a test specimen, and wherein the conductor structure has at least one impedance converter, wherein the impedance converter has a conductor segment having a gradually tapered or expanding cross-section.
Claims19
A contacting assembly forming an HF measuring tip, comprising:
- a carrier on which a conductor structure is arranged;
- said conductor structure including, at a contact end, at least five contact elements projecting from the carrier for making electrical contact with at least one contact point of a device under test, and wherein the conductor structure has an impedance converter, wherein the impedance converter has a conductor segment with gradually narrowing or widening cross section, wherein, of the projecting contact elements, two of said at least five contact elements in the form of ground contact elements are connected with a ground conductor arranged on the carrier and three remaining contact elements are connected with the conductor segment, wherein the ground conductor runs, starting out from the contact end, to a connection end, and wherein the contact elements projecting from the carrier are alternatingly connected, electrically, with the ground conductor and with the conductor segment.
Dependencies are inferred from the claim text.