Selective characterization of material under test (MUT) with electromagnetic impedance tomography and spectroscopy
AssigneeTransTech Systems, Inc.
InventorsSarah E. Pluta, Donald D. Colosimo, John W. Hewitt
Life of this patent
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AssigneeTransTech Systems, Inc.
InventorsSarah E. Pluta, Donald D. Colosimo, John W. Hewitt
Estimating the term…
A method of extracting complex impedance from selected volumes of the material under test (MUT) combined with various embodiments of electrode sensor arrays. Configurations of linear and planar electrode arrays provide measured data of complex impedance of selected volumes, or voxels, of the MUT, which then can be used to extract the impedance of selected sub-volumes or sub-voxels of the MUT through application of circuit theory. The complex impedance characteristics of the sub-voxels may be used to identify variations in the properties of the various sub-voxels of the MUT, or be correlated to physical properties of the MUT using electromagnetic impedance tomography and/or spectroscopy.
A system comprising:
A method of characterizing select volumes of a material under test (MUT) using an array of electrodes, the method comprising:
A computer program product comprising program code stored on a non-transitory computer readable medium, which when executed by at least one computing device coupled to a signal generator and an array of electrodes, causes the at least one computing device to execute a method of characterizing select volumes of a material under test (MUT) by performing actions including:
Dependencies are inferred from the claim text.