Defect analysis device, defect analysis method, and program
AssigneeNEC Corporation
InventorsMasatake Takahashi, Mizuho Tomiyama, Yasuhiro Sasaki
Life of this patent
Estimating the term…
Abstract
The present invention provides a defect analysis device including: an excitation unit (107) that imparts vibrations of a plurality of frequencies to a fluid (110) flowing through a pipe (108); a first detector (106) that, when the excitation part (107) is imparting vibrations, detects vibrations emanating from the pipe (108); and a signal processing unit (101) that extracts a feature quantity from a vibration waveform acquired by the first detector (106), and uses the extracted feature quantity to estimate the extent of a defect formed in the pipe (108).
Claims20
A defect analysis device including:
- vibration means for applying vibration with a plurality of frequency components to at least one of fluid flowing in a pipe and the pipe,
- first detection means for detecting the vibration applied by the vibration means, and
- signal processing means for extracting a feature amount from a vibration waveform acquired by the first detection means and for estimating a degree of defect formed in the pipe by using the extracted feature amount.
A defect analysis method in which a computer processor executes the steps of:
- applying vibration with a plurality of frequency components to at least one of fluid flowing in a pipe and the pipe,
- detecting the applied vibration with the plurality of frequency components,
- extracting a feature amount from a vibration waveform acquired in detecting the applied vibration, and
- estimating a degree of defect formed in the pipe by using the extracted feature amount.
A non-transitory computer-readable medium, storing a program which when executed by a computer causes the computer to perform a method comprising:
- applying vibration with a plurality of frequency components to at least one of fluid flowing in a pipe and the pipe,
- detecting the vibration applied by the vibration means,
- extracting a feature amount from a vibration waveform acquired by the computer, and
- estimating a degree of defect formed in the pipe by using the extracted feature amount.
Dependencies are inferred from the claim text.