Microspectroscopy device
AssigneeHitachi High-Technologies Corporation
InventorsTsuyoshi Sonehara, Hiromi Kusaka, Akira Fujii, Shuhei Yamamoto, Takeshi Ooura, Michiru Fujioka
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AssigneeHitachi High-Technologies Corporation
InventorsTsuyoshi Sonehara, Hiromi Kusaka, Akira Fujii, Shuhei Yamamoto, Takeshi Ooura, Michiru Fujioka
Estimating the term…
With a microspectroscopy device provided with an objective lens with a high numerical aperture, a defocus arises from thermal drift, etc., necessitating auto-focusing. Conventional auto-focus based on through-focus image acquisition takes time, and thus, it cannot be applied to continuous measurement over a long time wherein high-speed sampling is carried out. The present invention addresses this problem by having a defocus-sensing beam that has either defocus or astigmatism fall incident on the objective lens. Since how the image of the spot of the beam for defocus sensing blurs differs depending on the orientation of the defocus, real-time detection of the amount and orientation of defocus becomes possible, and high-speed realtime auto-focus becomes possible.
A microspectroscopy device comprising:
Dependencies are inferred from the claim text.