Optical configuration for measurement device
AssigneeMitutoyo Corporation
InventorDavid William Sesko
Life of this patent
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AssigneeMitutoyo Corporation
InventorDavid William Sesko
Estimating the term…
A scanning probe is provided for use with a coordinate measuring machine. The scanning probe includes a rotary position detection configuration which outputs X and Y position signals indicative of a rotation of a stylus coupling portion about a rotation center, and an axial position detection configuration which outputs a Z position signal indicative of the position of the stylus coupling portion along the axial direction. The Z position signal is substantially insensitive to motion of the axial detection deflector in at least one direction that is transverse to the axial direction. The X, Y and Z position signals may be processed to determine a 3D position of a contact portion of the stylus, which may include utilizing the Z position signal in combination with known trigonometry of the scanning probe to remove axial motion cross coupling components from the X and Y position signals.
A scanning probe for a coordinate measuring machine, the scanning probe comprising:
A method for determining a 3D position of a contact portion of a stylus based on position signals received from a scanning probe that the stylus is attached to, the method comprising:
A system for determining a 3D position of a contact portion of a stylus based on position signals received from a scanning probe that the stylus is coupled to, the system comprising:
Dependencies are inferred from the claim text.