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US 9,801,760 B2Granted
Test device for calibrating a laser device
AssigneeWavelight GmbH
InventorsEvi Goos, Christof Donitzky, Christian Wuellner
Life of this patent
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Abstract
A test device to calibrate the pulse energy of a laser device which provides pulsed laser radiation includes a measuring head with multiple measuring probes. The test device is used in such a way that by means of the laser radiation, multiple test ablations are made on a test surface, in an arrangement corresponding to the relative spatial arrangement of the measuring probes, and the depths of the test ablations are then measured, with simultaneous use of the multiple measuring probes of the measuring head.
Claims7
A method comprising:
- making, with pulsed laser radiation from a laser device, multiple test ablations on a test surface, the multiple test ablations formed in an arrangement corresponding to a relative spatial arrangement of a plurality of measuring probes on a measuring head of a separate test device;
- aligning a shape marking on the test surface with a complimentary shape marking on the test device to ensure a single relative angle of rotation orientation between the test surface and the measuring head, wherein the relative spatial arrangement of the multiple test ablations align with the plurality of measuring probes on the measuring head of the test device when the test surface and the measuring head are arranged in the single relative angle of rotation;
- simultaneously measuring, with the separate test device, a depth of each of the test ablations using the multiple measuring probes of the measuring head;
- and
- determining a relationship between a pulse energy of the pulsed laser radiations that formed each of the multiple test ablations and the depth of each of the test ablations.
2 more elements
Dependencies are inferred from the claim text.