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US 9,801,600 B2Granted
X-ray phase-contrast imaging
AssigneeRensselaer Polytechnic Institute
InventorsGe Wang, Yan Xi, Wenxiang Cong
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Abstract
Systems and methods for X-ray phase-contrast imaging (PCI) are provided. A quasi-periodic phase grating can be positioned between an object being imaged and a detector. An analyzer grating can be disposed between the phase grating and the detector. Second-order approximation models for X-ray phase retrieval using paraxial Fresnel-Kirchhoff diffraction theory are also provided. An iterative method can be used to reconstruct a phase-contrast image or a dark-field image.
Claims16
An X-ray phase-contrast imaging (PCI) system, comprising:
- an X-ray source;
- a detector;
- a first grating disposed between the X-ray source and the detector;
- and
- a second grating disposed between the first grating and the detector,
- wherein the first grating is a quasi-periodical phase grating such that a period of the first grating varies across the first grating and changes equally in both lateral directions.
3 more elements
Dependencies are inferred from the claim text.