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US 9,794,551 B1Granted
Light uniformity testing
AssigneeAmazon Technologies, Inc.
InventorsHyuk-Joon Oh, Eddie Alex Azuma
Life of this patent
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Abstract
Systems and methods for testing a light emitting device are described. A processing device receives a receiving an image of a beam of light substantially free of parallax distortion and determines one or more uniformity metrics of the beam of light based on the received image.
Claims18
A system comprising:
- a semi-transparent gray projection surface;
- a light emitting device comprising one or more light emitting diodes (LEDs), disposed on a first side of the projection surface, to emit a beam of light along a projection axis normal to the projection surface;
- an image capturing device, disposed on a second side of the projection surface opposite the first side, to capture an image of the projection surface that is substantially free of parallax distortion, wherein the image capturing device is disposed along the projection axis;
- and
- a processing device operatively coupled to the image capturing device, the processing device to:
- determine a roll-off value for the beam of light based on an intensity at a center of the image and an intensity at one or more corners of the image;
- and
- determine whether the device passes a uniformity test based on the roll-off.
5 more elements
A method comprising:
- receiving, by a processing device, an image of a projection of a beam of light transmitted through a projection surface, wherein the image of the projection of the beam of light is a raw image received from an image capturing device without processing to compensate for parallax distortion and wherein the image is substantially free of parallax distortion;
- and
- determining, by the processing device, one or more uniformity metrics of the beam of light based on the received image.
A system comprising:
- a projection surface;
- an image capturing device to capture an image of a projection, on the projection surface, of a beam of light emitted by a light emitting device and transmitted through the projection surface, wherein the image is substantially free of parallax distortion and wherein the beam of light is along a projection axis substantially normal to the projection surface and the image capturing device is disposed along the projection axis;
- and
- a processing device operatively coupled to the image capturing device, the processing device to determine one or more uniformity metrics of the beam of light based on the image.
1 more element
Dependencies are inferred from the claim text.