Combined laser processing system and focused ion beam system
AssigneeCarl Zeiss Microscopy GmbH
InventorCarl Kuebler
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AssigneeCarl Zeiss Microscopy GmbH
InventorCarl Kuebler
Estimating the term…
A processing system for forming a cross-section of an object. The processing system comprises a focused ion beam system for forming the cross-section from a pre-prepared surface region of the object and a laser and a light optical system for forming the pre-prepared surface region by laser ablation of a processing region of the object with a first and a second laser beam. The light optical system is configured to direct the first and the second laser beams onto common impingement locations of a common scanning line in the processing region for scanning the first laser beam and for scanning the second laser beam. For each of the impingement locations, an angle between a first incidence direction along an axis of the first laser beam and a second incidence direction along an axis of the second laser beam is greater than 10 degrees, measured in a stationary coordinate system.
A processing system for forming a cross-section of an object, the processing system comprising:
A processing system for forming a cross-section of an object, the processing system comprising:
A processing system for forming a cross-section of an object, the processing system comprising:
A method of operating a processing system for forming a cross-section from a prepared surface region of an object, wherein the processing system comprises:
A method of operating a processing system for forming a cross-section from a prepared surface region of an object, wherein the processing system comprises:
A method of operating a processing system for forming a cross-section from a prepared surface region of an object;
Dependencies are inferred from the claim text.