Apparatus of offset voltage adjustment in input buffer
AssigneeMicron Technology, Inc.
InventorSadayuki Okuma
Life of this patent
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Abstract
Apparatuses for providing external terminals of a semiconductor device are described. An example apparatus includes an input pad, an input buffer including a first input node and a second input node, a switch that couples the first input node and the second input node in an active state and further decouples the first input node and the second input node in an inactive state, a control circuit that provides a signal causing the switch to be in the active state or an inactive state. The first input node of the input buffer is coupled to the input pad by a conductive wiring.
Claims20
An apparatus comprising:
- an input pad;
- a first phase;
- a first input buffer including a first input node and a second input node;
- a conductive wiring configured to permanently couple between the input pad and the first input node of the first input buffer;
- and
- a first switch configured to couple the input pad to the second input node of the first input buffer;
- and
- wherein the first input buffer receives an active signal from an external terminal responsive to an enabling signal in the first phase.
An apparatus comprising:
- an input pad;
- a first input buffer including a first input node and a second input node, the first input node being permanently coupled to the input pad;
- and
- a first switch coupled between the first and second input nodes of the first input buffer, wherein the apparatus is configured to perform operations in a normal mode and a test mode, the test mode comprising a first phase and a second phase,
- wherein the first switch is open in the normal mode;
- and
- wherein the first switch is open in the first phase of the test mode and the first switch is closed responsive, at least in part, to a change of the test mode from the first phase to the second phase;
- and
- wherein the first input buffer adjusts an offset voltage in the second phase responsive to a test signal.
An apparatus comprising:
- an input pad;
- a first phase;
- a first input buffer comprising a first input node and a second input node;
- a first switch configured to couple the first input node and the second input node in an active state and further configured to decouple the first input node and the second input node in an inactive state;
- a control circuit configured to provide a signal causing the first switch to be in the active state or an inactive state responsive to an inactive latch enable signal in the first phase of a test mode,
- wherein the first input node is coupled to the input pad.
Dependencies are inferred from the claim text.