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US 9,792,518 B2Granted
Method and system for aligning and classifying images
AssigneeChristopher L. Kavanau
InventorsChristopher L. Kavanau, Luisa Montesano
Life of this patent
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Abstract
In one embodiment, L dimensional images are trained, mapped, and aligned to an M dimensional topology to obtain azimuthal angles. The aligned L dimensional images are then trained and mapped to an N dimensional topology to obtain 2N vertex classifications. The azimuthal angles and the 2N vertex classifications are used to map L dimensional images into 0 dimensional images.
Claims1
A system for aligning and classifying images of an object, comprising:
- one or more processors configured to:
- train, map, and align a set of 2-dimensional images to an O-dimensional cylindrical topology to obtain azimuthal angles with respect to the 2-dimensional images;
- train and map the aligned 2-dimensional images to an N-dimensional topology to obtain a set of 2N vertex classifications;
- map the 2-dimensional images to M-dimensional constructs based upon the set of 2N vertex classifications and the azimuthal angles;
- and
- display a reconstructed mold of the object for classification.
3 more elements
Dependencies are inferred from the claim text.