Identifying a configuration element value as a potential cause of a testing operation failure

A system comprising:

• a processor;
• and
• a memory storing instructions that when executed by the processor cause the processor to:
• cause a mirror testing operation of a mirror testing process to be performed approximately in parallel on each of a plurality of instances of an application, each instance executed in a respective one of a plurality of testing environments having different configurations from one another;
• acquire, from each of the testing environments, configuration element values for the testing environment, the values defining the configuration of the testing environment;
• determine that the mirror testing operation has failed at a first one of the testing environments and succeeded at a second one of the testing environments;
• in response to the determination, compare the configuration element values for the first testing environment to the configuration element values for the second testing environment, respectively;
• and
• identify, as a potential cause of the mirror testing operation failure, one of the configuration element values acquired from the first testing environment that differs from the respective value of the same configuration element acquired from the second testing environment.

A method comprising:

• causing, by a processor of a computing device, a mirror testing operation to be performed in parallel on each of a plurality of instances of an application, wherein each instance is executed in a respective one of a plurality of testing environments having different configurations from one another;
• acquiring, from each of the testing environments, configuration element values for the testing environment, the values defining the configuration of the testing environment;
• determining, by the processor, that the mirror testing operation has failed at a first testing environment of the plurality of testing environments and has passed at a second testing environment of the plurality of testing environments;
• in response to the determination, identifying, as potential causes of the failure, a plurality of configuration element values acquired from the first testing environment that differ from the respective values of the same configuration elements acquired from the second testing environment;
• and
• ranking, by the processor, the identified configuration element values acquired from the first testing environment based on, for each of the identified values, a likelihood of the identified value being a cause of the failure.