End of life prediction to reduce retention triggered operations

A method for measuring wear comprising:

• performing the following in a storage device comprising blocks of memory:
• determining a read disturb;
• modifying an amount of usage of the blocks to account for the read disturb of each of the blocks in order to extend an end of retention point for those blocks with higher read disturb, and to increase the amount of usage of those blocks with a lower read disturb;
• and
• modifying retention triggering operations based on the end of retention point.

A storage device comprising a controller and memory blocks, wherein the processor is configured for:

• calculating a bit error rate slope for each of the memory blocks, wherein the bit error rate slope comprises a change of bit errors over time;
• determining an end of life point based on the bit error rate slope for each of the memory blocks, wherein the end of life point comprises an average time for the bit error rate slopes from the memory blocks to converge with a minimum error threshold;
• and
• adjusting usage of the memory blocks based on the bit error rate slope such that the bit error rate slope for each of the memory blocks should be adjusted towards the end of life point.