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US 9,791,512 B2Granted
Test apparatus, test method, calibration device, and calibration method
AssigneeAdvantest Corporation
InventorsShin Masuda, Hideo Hara, Tsuyoshi Ataka
Life of this patent
Estimating the term…
Abstract
Provided is a test apparatus including an optical test signal generating section that generates an optical test signal; an optical signal supplying section that supplies the optical test signal to a device under test that is a testing target among a plurality of the devices under test; a first optical switch section that selects, from among optical signals output by the plurality of devices under test, the optical signal output by the device under test that is the testing target; and an optical signal receiving section that receives the selected optical signal.
Claims16
A test apparatus comprising:
- an optical test signal generating section that generates an optical test signal;
- an optical signal supplying section that supplies the optical test signal to a device under test that is a testing target among a plurality of the devices under test;
- a first optical switch section that selects, from among the plurality of devices under test, the device under test that is the testing target;
- and
- an optical signal receiving section that receives an optical signal output by the device under test that is the testing target,
- an electrical test signal generating section that generates an electrical test signal for testing the plurality of devices under test;
- an electrical interface that supplies the electrical test signal to each of the devices under test, receives electrical signals output by the devices under test, and outputs each of the received electrical signals;
- and
- an electrical signal receiving section that receives the electrical signals, wherein
- the test apparatus tests one of the devices under test that includes a plurality of opto-electrical converting sections that convert optical signals into electrical signals and a plurality of electro-optical converting sections that convert electrical signals into optical signals,
- the first optical switch section receives the optical signal output by one or more of the electro-optical converting sections of the device under test in response to the electrical test signal generated by the electrical test signal generating section, and supplies the received optical signal to the optical signal supplying section, and
- the optical signal supplying section supplies the device under test that is the testing target with the received optical signal, as the optical test signal.
9 more elements
A method comprising:
- generating, by an optical test signal generating section, an optical test signal;
- supplying, by an optical signal supplying section, the optical test signal to a device under test that is a testing target among a plurality of the devices under test;
- selecting, by a first optical switch, from among the plurality of devices under test, the device under test that is the testing target;
- receiving, by an optical signal receiving section, an optical signal output by the device under test that is the testing target;
- switching, by a second optical switch, which one of the optical test signal and the optical signal output by the device under test that is the testing target from the first optical switch section is supplied to the device under test that is the testing target,
- switching, by a third optical switch, which one of the optical signal receiving section and the second optical switch the optical signal output by the device under test that is the testing target from the first optical switch is supplied to.
3 more elements
A method comprising:
- generating, by an electrical test signal generating section, an electrical test signal for testing a device under test includes a plurality of opto-electrical converting sections that convert optical signals into electrical signals and a plurality of electro-optical converting sections that convert electrical signals into optical signals;
- receiving, by an optical signal receiving section, the optical signal output by one or more of the electro-optical converting sections of the device under test in response to the electrical test signal;
- supplying by an optical signal supplying section, the device under test with the received optical signal, as an optical test signal;
- and
- receiving, by an electrical signal receiving section, an electrical signal output by an opto-electrical converting section of the device under test in response to the optical test signal.
2 more elements
A method comprising:
- generating, by an optical test signal generating section, an optical test signal;
- supplying, by an optical signal supplying section, the optical test signal to a device under test that is a testing target among a plurality of the devices under test;
- selecting, by a first optical switch, from among the plurality of devices under test, the device under test that is the testing target;
- receiving, by an optical signal receiving section, an optical signal output by the device under test that is the testing target;
- and
- detecting, by a first detecting section, optical intensity of each of the optical signals output by the plurality of devices under test, wherein the detecting includes:
- branching, by a branching coupler, an optical signal input thereto;
- measuring, by a first optical intensity measuring section, intensity of one of the optical signals resulting from the branching by the branching coupler;
- passing, by a filter section, an optical signal with a predetermined wavelength band in the other of the optical signals resulting from the branching by the branching coupler;
- and
- measuring, by a second optical intensity measuring section, intensity of the optical signal passed by the filter section.
8 more elements
Dependencies are inferred from the claim text.