US 9,791,506 B1Granted

Cross-platform device testing through low level drivers

AssigneeAmazon Technologies, Inc.

InventorsYaniv Meidan, Ronen Shitrit, Guy Zalik, Barak Wasserstrom

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Abstract

In one example case, a cross-platform system includes a first automated test platform having a first test instrument and a first glue layer interface that exposes test functions to direct testing by the first test instrument. The system further includes a second automated test platform having a second test instrument and a second glue layer interface that exposes the same test functions to direct testing by the second test instrument. In the system, the glue layers abstract the respective and different control commands used by the different, first and second test instruments. Using the glue layers, the same higher-level test code can be executed by the control computers of both the first and second automated test platforms.

Claims20

Dependent claims

An automated test platform, comprising:

a first test instrument to evaluate a semiconductor device under test;
a first control computer configured to direct the first test instrument, the first control computer comprising a first memory that stores first computer-readable instructions for testing the semiconductor device and a processor to execute the first computer-readable instructions, wherein the first computer-readable instructions define at least:
a test layer that defines a sequence of tests for evaluation of the semiconductor device;
a device hardware abstraction layer that generates, based on the sequence of tests, a signaling transaction to test the semiconductor device according to an operating specification of the semiconductor device, the signaling transaction defining at least one logic level for at least one control signal input of the semiconductor device at a particular timing;
and
a first glue layer that exposes a plurality of test functions for the first control computer to direct the first test instrument and generates a set of control commands for the first test instrument to carry out the signaling transaction on the semiconductor device using the first test instrument;
and
a second control computer comprising a second memory that stores second computer-readable instructions, wherein the second computer-readable instructions define a second glue layer that exposes the plurality of test functions and generates a second set of control commands for a second test instrument to carry out the signaling transaction using a second test instrument.

5 more elements

A method of cross-platform testing, comprising:

performing, on a first automated test platform, a sequence of tests defined in test code to evaluate a semiconductor device under test, wherein performing the sequence of tests on the first automated test platform comprises:
generating, by a first control computer of the first automated test platform, a signaling transaction to test the semiconductor device based on the sequence of tests;
exposing, by the first control computer, a plurality of test functions to direct a first test instrument of the first automated test platform;
and
converting, by the first control computer, a call to at least one of the plurality of test functions into a first set of control commands to direct the first test instrument to carry out the signaling transaction on the semiconductor device;
and
performing, on a second control computer of a second automated test platform, the sequence of tests defined in the test code to evaluate the semiconductor device under test, the second automated test platform including a second test instrument directed by a second set of control commands to carry out the signaling transaction on the semiconductor device.

4 more elements

A cross-platform test system, comprising:

a first automated test platform, comprising:
a first test instrument controller to direct a first test instrument;
and
a first glue layer interface that exposes a plurality of test functions to direct testing by the first test instrument;
and
a second automated test platform, comprising:
a second test instrument controller to direct a second test instrument;
and
a second glue layer interface that exposes the plurality of test functions to direct testing by the second test instrument, wherein the first test instrument is controlled by different control commands than the second test instrument.

6 more elements

Dependencies are inferred from the claim text.