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US 9,791,505 B1Granted
Full pad coverage boundary scan
AssigneeTexas Instruments Incorporated
InventorsPrakash Narayanan, Rajesh Mittal, Rajat Mehrotra
Life of this patent
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Abstract
An integrated circuit, comprising functional circuitry and testing circuitry. A first set of pads is operable in a first state for communicating testing signals to the testing circuitry and operable in a second state for communicating input/output signals to the functional circuitry. A second set of pads, differing from the first set of pads, is operable in the second state for communicating testing signals to the testing circuitry for testing signals associated in the second state with the first set of pads.
Claims12
An integrated circuit, comprising:
- functional circuitry;
- testing circuitry;
- a first set of pads operable in a first state for communicating testing signals to the testing circuitry and operable in a second state for communicating input/output signals to the functional circuitry;
- and
- a second set of pads, differing from the first set of pads, operable in the second state for communicating testing signals to the testing circuitry for testing signals associated in the second state with the first set of pads.
2 more elements
Dependencies are inferred from the claim text.