US 9,791,504 B2 · Contactor arrangement, IC test handler and IC test arrangement

Abstract

Contactor arrangement of an IC test handler, comprising: a contactor unit which has test contacts for contacting an IC in test and for temporarily pressing the IC against the test contacts, a plunger head, which has a recessed central region corresponding to the geometrical configuration of the IC, such that those surface of the IC which is adjacent to the upper surface of the plunger head does not touch the plunger head surface, and a contactor unit interface, which includes a vacuum suction system for actively attracting the IC to an IC contact surface of the contactor unit interface, that corresponds with an adjacent surface of the IC having IC device contacts and, thus, towards the test contacts of the contactor unit.

Claims16

Dependent claims

A contactor arrangement, comprising:

a contactor unit that has test contacts for contacting an IC or a group of ICs in test and for temporarily pressing the IC against the test contacts,
a plunger head, which has a recessed central region in an upper surface of the plunger head, the recessed central region corresponding to a geometrical configuration of the IC, such that a lower surface of the IC which is opposite the recessed central region does not touch the upper surface of the plunger head, and
a contactor unit interface, which includes a vacuum suction system for actively attracting the IC to an IC contact surface of the contactor unit interface that corresponds with an adjacent an upper surface of the IC having IC device contacts and towards the test contacts of the contactor unit.

Dependencies are inferred from the claim text.

Facts

Application

14/790,022Filed 2 Jul 2015

Priority

EP 141756023 Jul 2014

Published

US 2016/0003897 A17 Jan 2016

Granted

17 Oct 2017

Term ends

Not estimatedThe source records don’t support an estimate.

Classification5 codes

G01R 31/2891
Features relating to contacting the IC under test, e.g. probe heads; chucks: related to sensing or controlling of force, position, temperature
G01R 1/0408
Housings; Supporting members; Arrangements of terminals: test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
G01R 31/2887
Features relating to contacting the IC under test, e.g. probe heads; chucks: involving moving the probe head or the IC under test; docking stations
G01R 31/2889
Features relating to contacting the IC under test, e.g. probe heads; chucks: interfaces, e.g. between probe and tester

Contactor arrangement, IC test handler and IC test arrangement

Life of this patent

Contactor arrangement, IC test handler and IC test arrangement

Life of this patent

Abstract

Claims16