Back to results
US 9,791,475 B2Granted
Non-contact voltage measuring apparatus
AssigneeOMRON Corporation
InventorMao Ogimoto
Life of this patent
Estimating the term…
Abstract
There is provided a non-contact voltage measuring sensor (1) in which a detection probe (11) is configured with a leaf spring and in which, when an external force is applied, the detection probe (11) deforms winding in a direction in which a tension of the leaf spring acts.
Claims4
A non-contact voltage measuring apparatus that measures a measurement object voltage applied to a conductive wire, the non-contact voltage measuring apparatus comprising:
- a detection probe configured to measure the measurement object voltage, while being wound around the conductive wire, based on an induced voltage generated on the detection probe when the detection probe is brought in close proximity to but not in contact with the conductive wire so as to create a coupling capacitance between the detection probe and the conductive wire,
- wherein the detection probe elastically deforms between a first state in which the detection probe extends in a longitudinal direction of the detection probe against a tension acting in the detection probe and a second state in which the detection probe winds in a direction in which the tension acts, and
- the direction in which the tension acts is oblique to the longitudinal direction of the detection probe.
Dependencies are inferred from the claim text.