Devices and systems for spatial averaging of electron backscatter diffraction patterns
AssigneeEDAX, Incorporated
InventorsStuart Ian Wright, Matthew McBride Nowell, Scott Perry Lindeman, Patrick Paul Camus
Life of this patent
Estimating the term…
Abstract
A diffraction pattern is averaged with adjacent diffraction patterns to increase a signal to noise ratio thereof and improve indexing accuracy. The pixels of a diffraction pattern image are averaged with a correlated pixel from one or more adjacent diffraction patterns. Noise artifacts are reduced in intensity, while signals present in each of the patterns reinforce one another to produce an averaged diffraction pattern which is then indexed.
Claims20
A method for spatially averaging diffraction patterns comprising:
- acquiring a central diffraction pattern and a plurality of adjacent diffraction patterns from an electron backscatter diffraction detector;
- averaging the central diffraction pattern with one or more of the plurality of adjacent diffraction patterns to produce an averaged diffraction pattern;
- and
- indexing the averaged diffraction pattern to produce an averaged crystal orientation.
A system for spatially averaging diffraction patterns comprising:
- an electron backscatter detector;
- one or more hardware processors in data communication with the electron backscatter detector;
- and
- one or more storage devices having stored computer-executable instructions which, when executed by the one or more hardware processors, are configured to cause the computing system to perform a method including:
- acquiring a central diffraction pattern;
- acquiring a plurality of adjacent diffraction patterns;
- comparing the central diffraction pattern to one or more of the plurality of adjacent diffraction patterns;
- averaging at the central diffraction pattern with one or more of the plurality of adjacent diffraction patterns to produce an averaged diffraction pattern;
- and
- indexing the averaged diffraction pattern to produce an averaged crystal orientation.
A method for calculating crystallographic orientations comprising:
- acquiring a diffraction pattern set having a plurality of diffraction patterns therein;
- indexing a plurality of the diffraction patterns to calculate one or more misorientations;
- correlating a plurality of misorientations to identify one or more grains;
- averaging a central diffraction pattern with one or more adjacent diffraction patterns based upon the one or more grains to produce an averaged diffraction pattern;
- and
- indexing the averaged diffraction pattern to produce an averaged orientation.
Dependencies are inferred from the claim text.